Publications (click on the article to download)

  1. UST brochure
  2. Activation Station brochure
  3. PV brochure
  4. Ceramic brochure
  5. Armor plates brochure
  6. Inline diamond wire inspection based on resonant vibrations - Hubert Seigneur, Sergei Ostapenko, Igor Tarasov, Chad Rodrigues, Yuriy Zaikin, Kevin Morrow & Winston V. Schoenfeld,, 2016, v 31
  7. Full Paper - 37th IEEE PVSC Conference - Seattle, Washington, June 2011
  8. UST Poster - 37th IEEE PVSC Conference - Seattle, Washington, June 2011
  9. Effect of Handling Stress on Resonance Ultrasonic Vibrations in Thin Silicon Wafers - Hao Wu, Shreyes N. Melkote, Anton Belyaev, Igor Tarasov, Deven Cruson and Sergei Ostapenko, (2010) Proceedings of the 35th IEEE Photovoltaic Specialists Conference, Honolulu
  10. Breakage Reduction in Solar Cell Production Using Resonance Ultrasonic Vibration Inspection - Sergei Ostapenko, Anton Belyaev, Yusuf Emirov, Igor Tarasov, Mark Verstraten, Michel van Dooren, Pier Giuseppe Fumei, Guus van Veghel, Arvid van der Heide, (2009) Proceedings of the 34th IEEE Photovoltaic Specialists Conference
  11. Resonance Ultrasonic Vibrations for In-line Crack Detection in Silicon Wafers and Solar Cells - A. Monastyrskyi, S. Ostapenko, O. Polupan, H. Maeckel, and M. A. Vazquez, (2008) Proceedings of 33rd PVSC
  12. Resonance Ultrasonic Vibrations for Crack Detection in Photovoltaic Silicon Wafers - W. Dallas, O. Polupan, and S. Ostapenko, (2007)
  13. Crack detection and analyses using resonance ultrasonic vibrations in full-size crystalline silicon wafers - A. Belyaev, O. Polupan, W. Dallas, S. Ostapenko and D. Hess, Applied Physics Letters 88, 111907 (2006)
  14. Resonance ultrasonic vibration diagnostics of elastic stress in full-size silicon wafers - A. Belyaev, O. Polupan, S. Ostapenko, D. Hess and J. P. Kalejs, Institute of Physics Publishing, Semicond. Sci. Technol. 21 (2006) 254–260
  15. Residual stresses in polycrystalline sheet silicon and it's relation to lifetime - S. He, S. Danyluk, I. Tarasov, S. Ostapenko Center for Microelectronics Research, University of South Florida, March 11, 2005
  16. Nonlinear resonance ultrasonic vibrations in Czochralski-silicon wafers - S. Ostapenko and I. Tarasov, Applied Physics Letters, Volume 76, Number 16, 17 April 2000
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Ultrasonic Technologies
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Wesley Chapel, FL 33544 USA
Phone: (813) 973-1702
Unit 6 Queens Yard
Whita Post Lane, London
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