Crack detection, commercial products, si silicon wafers, solar cells, integrated circuits

Ultrasonic Technologies, Inc
Ultimate Smart Tools

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Contact Ultrasonic Technologies:

  3650 Spectrum Blvd, ste. 170
  Tampa, FL 33612
  USA
  Phone: (813) 866-6991
  Phone: (813) 379-8358
  Fax: (813) 398-6987
  Send Email

RUV - Production. Inline Crack Detection.

Ultrasonic Technologies offers a complete range of products and services aimed to provide accurate and quick crack detection in Si wafers, solar cells, and integrated circuits.
Model RUV-3
Model RUV-2

Resonance Ultrasonic Vibration System, Model RUV-3

System Description

The latest tool in crack detection, Ultrasonic Technologies is now offering Resonance Ultrasonic Vibration (RUV), model 3 for inline detection of cracked wafers and cells in standard solar cell production lines with automatic, pick-and-place robot-controlled wafers loading and unloading.

This model is well suited as a quality control and crack detection tool can be used at any stage of the solar panel production cycle.

This tool is highly customizable to different solar cell production lines.

System Description

Measurement cycle:

2 seconds per wafer

Wafer Dimensions:

Minimum: 100 mm. x 100 mm.

Maximum: 210 mm. x 210 mm.

Strings: Yes

Wafer load/unload:

Robot pick-and-place

Full software control

Operational modes:

Calibration and production

Customization:

Plug and play to specific production line

System stability:

Tested over time

The system utilizes a concept of fast, non-destructive measurements on full-size Si wafers increasing the yield of the PV production lines. RUV system is a computer controlled unit with the Windows-based software providing system operation, data acquisition and data processing.

Resonance Ultrasonic Vibration System, Model RUV-2

System Description
Resonance Ultrasonic Vibration (RUV) system uses innovative approach to access mechanical quality of the full-size crystalline silicon (Si) wafers using patented technology [1]. The model RUV-2 is specifically adopted to perform fast crack and stress detection providing an operator with a Good / Crack Detected signal for each measured unit.

RUV System is customizable to work in almost every stage of a typical PV production line.

The system utilizes a concept of fast, non-destructive measurements on full-size Si wafers increasing the yield of the PV production lines [2], [3].RUV system is a computer controlled unit with the Windows-based software providing system operation, data acquisition and data processing.

PV Production Lines greatly benefit by increased line yield and reduced sample breakage (line downtimes)

System Specifications

Measurement cycle:

2 seconds per wafer

Wafer Dimensions:

Minimum: 100 mm. x 100 mm.

Maximum: 210 mm. x 210 mm.

Strings: Yes

Wafer load/unload:

Full software control

Operational modes:

Calibration and production

Customization:

Plug and play to specific production line

System stability:

Tested over time

[1] U.S.patent
[2] Appl. Phys. Lett. (2006), v. 88, 111907.
[3] Semiconductor Science and Technology (2006), v. 21, 254.